RTX2012 HS RF Tester

The RTX2012 HS RF Test Platform for DECT/DECT 6.0/CAT-iq/Japan DECT supports a wide range of RF tests in connected mode (signalling mode) and is the second generation of CAT-iq RF testers in the market.

Due to the High Performance (HS) measurement capability it is especially designed for high throughput manufacturing applications and the new benchmark for DECT/DECT 6.0/CAT-iq RF testers. It's extended measurement capabilities make it a perfect tool from certification, throughout R&D and to manufacturing test.

The tester can basically be setup as either a fixed part (FP) or portable part (PP), with added test and control capabilities compared to non-signalling mode.

The user controls the tester via the included Windows® based user interface for manual operation and for automatic applications. Externally the tester can be controlled by SCPI commands.

Signalling mode
The use of signalling mode in the RTX2012 HS Communication Tester, enables the user to measure a comprehensive range of key RF parameters compared to non-signalling mode. For example is the receiver sensitivity easily measured as BER / FER, due to the loopback capability enabled by signalling mode.   

The tester is designed for rough production environments and is streamlined to high reliability and short test time, with highly efficiency and accurate execution of the measurements. 

RTX2012 HS RF tester case story